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This is our newest of two Atomic Force Microscopes (AFM). This AFM can also be used as a Scanning Tunneling Microscope (STM). It is a Nanoscope IV model AFM.
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This is our second AFM. It is a Thermomicroscopes Explorer AFM system. We have modified this AFM to be used as a near-field microwave probe. Other electrical measurement capabilities such as IV measurements have also been added to this versatile tool.
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This is a computer-controlled scanning platform to create images using different types of microwave near-field probes. The computer controls an x and y axis, a rotary stage, and a z-axis using Labview. Distance control can be performed using a variety of signals with the computer correcting the z-axis based upon the given value. The scan program can be used in conjuction with the network analyzer to perform spectroscopy at given points as well.
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We have a collaboration to develop implantable spinal sensors to measure forces. This station has been equipped with a force sensor attached to a liner stage so that increasing force can be applied and held. We have a pressure vessel that we can use to test the capabilities of our sensors.
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Our probe station consists of a microscope camera with monitor, many vacuum probes, a state of the art Tektronix 2.4GHz Oscilliscope, and one of our three Semiconductor Parameter Analyzer.
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We have acquired a wire bonder to enable us to access our devices fabricated at the Case Micro Fabrication Laboratory (MFL).
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This is our general measurement station. We can perform several different types of IV measurements as well as analysis of LCR Network Parameters vs. Frequencies from 20 Hz to 1 MHz.
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This is an evaporator that has been modified for Carbon Nanotube Growth. Our group is a leader in the use of carbon nanotubes to create functional devices for sensing and measurement.
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This evaporator is used for the deposition of metals. We also have a sputter coating machine.
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